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Scanning and transmission electron microscopy : an introduction

Author: Stanley L Flegler; John William Heckman; Karen L Klomparens
Publisher: New York : Oxford University Press, 1995.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

This textbook for courses on electron microscopy is intended for use in any laboratory. The book presents the practical and theoretical fundamentals of scanning and transmission electron microscopy  Read more...

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Document Type: Book
All Authors / Contributors: Stanley L Flegler; John William Heckman; Karen L Klomparens
ISBN: 9780195107517 0195107519
OCLC Number: 911288271
Notes: Publicado originalmente: New York : W.H. Freeman, c1993.
Description: VIII, 225 p. : il. ; 26 cm
Contents: 1: Introduction2: Electron Sources and Electron Lenses2.1: Electron Sources2.2: Electron Lenses3: Vacuum Systems3.1: Vacuum Pumps Commonly Used in EM Labs3.2: Methods of Measuring Vacuums3.3: Vacuum Systems Used in Electron Microscopy4: The Transmission Electron Microscope4.1: Theory of Operation4.2: Real Images4.3: Virtual Images4.4: Depth of Field and Depth of Focus4.5: Anatomy of a Transmission Electron Microscope4.6: Medium- and High-Voltage Transmission Electron Microscopy5: The Scanning Electron Microscope5.1: Theory of Operation5.2: Specimen-Beam Interactions5.3: Machine Variables5.4: Ultrahigh-Resolution SEMS5.5: Environmental SEMS5.7: Scanning Tunneling and Atomic Force Microscopy6: Specimen Preparation for TEM6.1: Negative Staining of Small Particulates6.2: Ultrathin Sectioning of Larger Samples6.3: Vacuum Evaporators and Evaporation Techniques6.4: Shadowcasting and Replica Techniques6.5: Cytological Techniques6.6: Preparation of Nonbiological Materials7: Specimen Preparation for SEM7.1: Mounting7.2: Coating for Conductivity7.3: Special Methods for Various Sample Types7.4: Biological Sample Preparation7.5: Alternative Methods for Biological Samples7.6: SEM Histochemistry for Biological Samples8: X-Ray Analysis8.1: X-ray Production and Naming8.2: Measuring the Energy and Wavelength of X Rays8.3: Construction of the EDS Detector8.4: Construction of the EDS X-Ray Analyzer8.5: Outputs8.6: Spectrum Accumulation and Interpretation8.7: Optimizing the Detection of X Rays8.8: Artifacts8.9: Quantitative Analysis8.10: Sample Preparation9: Electron Micrographic Techniques9.1: Silver Graphic Process9.2: Photographic Printing9.3: Transmission Electron Micrography9.4: Scanning Electron Micrography9.5: The Electronic Darkroom9.6: Micrograph Presentation and Publication
Responsibility: Stanley L. Flegler, John W. Heckman, Jr., Karen L. Klomparens.

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'the authors have been able to provide an authoritative impressive, and comprehensive spectrum of electron microscopy theory and practice in easily readable prose, accompanied by useful graphics ... Read more...

 
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