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Semiconductor material and device characterization

Author: Dieter K Schroder
Publisher: [Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, ©2006.
Edition/Format:   eBook : Document : English : 3rd edView all editions and formats
Summary:
This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations  Read more...
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Genre/Form: Electronic book
Electronic books
Additional Physical Format: Print version:
Schroder, Dieter K.
Semiconductor material and device characterization.
[Piscataway, NJ] : IEEE Press ; Hoboken, N.J. : Wiley, ©2006
(DLC) 2005048514
(OCoLC)59360243
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Dieter K Schroder
ISBN: 0471749087 9780471749080 9780471749097 0471749095
OCLC Number: 163140623
Notes: "Wiley-Interscience."
Description: 1 online resource (xv, 779 pages) : illustrations
Contents: Resistivity --
Carrier and doping density --
Contact resistance and Schottky barriers --
Series resistance, channel length and width, and threshold voltage --
Defects --
Oxide and interface trapped charges, oxide thickness --
Carrier lifetimes --
Mobility --
Charge-based and probe characterization --
Optical characterization --
Chemical and physical characterization --
Reliability and failure analysis.
Responsibility: Dieter K. Schroder.

Abstract:

This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully  Read more...

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"I strongly recommend this book for those who want to learn device characterization." (IEEE Circuits & Devices Magazine, November/December 2006)

 
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<http://www.worldcat.org/oclc/163140623> # Semiconductor material and device characterization
    a schema:Book, schema:CreativeWork, schema:MediaObject ;
    library:oclcnum "163140623" ;
    library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nju> ;
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/549801#Place/piscataway_nj> ; # Piscataway, NJ
    library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/549801#Place/hoboken_n_j> ; # Hoboken, N.J.
    rdfs:comment "Warning: This malformed URI has been treated as a string - 'http://images.contentreserve.com/ImageType-100/0128-1/{208B94DE-FAE2-48A5-BEDD-F9885634B441}Img100.jpg'" ;
    schema:about <http://experiment.worldcat.org/entity/work/data/549801#Topic/technology_&_engineering_electronics_solid_state> ; # TECHNOLOGY & ENGINEERING--Electronics--Solid State
    schema:about <http://dewey.info/class/621.38152/e22/> ;
    schema:about <http://id.worldcat.org/fast/1112261> ; # Semiconductors--Testing
    schema:about <http://id.loc.gov/authorities/subjects/sh85119917> ; # Semiconductors--Testing
    schema:about <http://experiment.worldcat.org/entity/work/data/549801#Topic/technology_&_engineering_electronics_semiconductors> ; # TECHNOLOGY & ENGINEERING--Electronics--Semiconductors
    schema:about <http://id.worldcat.org/fast/1112198> ; # Semiconductors
    schema:bookEdition "3rd ed." ;
    schema:bookFormat schema:EBook ;
    schema:copyrightYear "2006" ;
    schema:creator <http://viaf.org/viaf/27148728> ; # Dieter K. Schroder
    schema:datePublished "2006" ;
    schema:description "Resistivity -- Carrier and doping density -- Contact resistance and Schottky barriers -- Series resistance, channel length and width, and threshold voltage -- Defects -- Oxide and interface trapped charges, oxide thickness -- Carrier lifetimes -- Mobility -- Charge-based and probe characterization -- Optical characterization -- Chemical and physical characterization -- Reliability and failure analysis."@en ;
    schema:description "This Third Edition updates a landmark text with the latest findings The Third Edition of the internationally lauded Semiconductor Material and Device Characterization brings the text fully up-to-date with the latest developments in the field and includes new pedagogical tools to assist readers. Not only does the Third Edition set forth all the latest measurement techniques, but it also examines new interpretations and new applications of existing techniques. Semiconductor Material and Device Characterization remains the sole text dedicated to characterization techniques for measuring semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods, including the more specialized chemical and physical techniques. Readers familiar with the previous two editions will discover a thoroughly revised and updated Third Edition, including: . Updated and revised figures and examples reflecting the most current data and information. 260 new references offering access to the latest research and discussions in specialized topics. New problems and review questions at the end of each chapter to test readers' understanding of the material In addition, readers will find fully updated and revised sections in each chapter. Plus, two new chapters have been added: . Charge-Based and Probe Characterization introduces charge-based measurement and Kelvin probes. This chapter also examines probe-based measurements, including scanning capacitance, scanning Kelvin force, scanning spreading resistance, and ballistic electron emission microscopy. Reliability and Failure Analysis examines failure times and distribution functions, and discusses electromigration, hot carriers, gate oxide integrity, negative bias temperature instability, stress-induced leakage current, and electrostatic discharge. Written by an internationally recognized authority in the field, Semiconductor Material and Device Characterization remains essential reading for graduate students as well as for professionals working in the field of semiconductor devices and materials. An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department."@en ;
    schema:exampleOfWork <http://worldcat.org/entity/work/id/549801> ;
    schema:genre "Electronic book"@en ;
    schema:genre "Electronic books"@en ;
    schema:inLanguage "en" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/59360243> ;
    schema:name "Semiconductor material and device characterization"@en ;
    schema:productID "163140623" ;
    schema:publication <http://www.worldcat.org/title/-/oclc/163140623#PublicationEvent/piscataway_nj_ieee_press_hoboken_n_j_wiley_2006> ;
    schema:publisher <http://experiment.worldcat.org/entity/work/data/549801#Agent/ieee_press> ; # IEEE Press
    schema:publisher <http://experiment.worldcat.org/entity/work/data/549801#Agent/wiley> ; # Wiley
    schema:url <http://VH7QX3XE2P.search.serialssolutions.com/?V=1.0&L=VH7QX3XE2P&S=JCs&C=TC0000244006&T=marc&tab=BOOKS> ;
    schema:url <http://public.ebookcentral.proquest.com/choice/publicfullrecord.aspx?p=275904> ;
    schema:url <http://proxy.library.carleton.ca/login?url=https://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928> ;
    schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&doc_number=015047605&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
    schema:url <https://www.overdrive.com/search?q=208B94DE-FAE2-48A5-BEDD-F9885634B441> ;
    schema:url <http://onlinelibrary.wiley.com/doi/book/10.1002/0471749095> ;
    schema:url <http://dx.doi.org/10.1002/0471749095> ;
    schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015047605&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
    schema:url <http://www3.interscience.wiley.com/cgi-bin/bookhome/110438578/ProductInformation.html> ;
    schema:url <http://site.ebrary.com/id/10305091> ;
    schema:url <http://www.library.yorku.ca/e/resolver/id/1934604> ;
    schema:url <http://0-onlinelibrary.wiley.com.pugwash.lib.warwick.ac.uk/book/10.1002/0471749095> ;
    schema:url <http://catalogimages.wiley.com/images/db/jimages/9780471739067.jpg> ;
    schema:url <http://0-onlinelibrary.wiley.com.pugwash.lib.warwick.ac.uk/doi/book/10.1002/0471749095> ;
    schema:url <http://ieeexplore.ieee.org.ezproxy.aub.edu.lb/xpl/bkabstractplus.jsp?bkn=5237928> ;
    schema:url <http://www.library.yorku.ca/e/resolver/id/1934605> ;
    schema:url <http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=015047605&sequence=000002&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA> ;
    schema:url <https://onlinelibrary.wiley.com/doi/book/10.1002/0471749095> ;
    schema:url <http://public.eblib.com/choice/publicfullrecord.aspx?p=275904> ;
    schema:url <http://www.ECU.eblib.com.au/EBLWeb/patron/?target=patron&extendedid=E_196499userid=%5Eu> ;
    schema:url "http://images.contentreserve.com/ImageType-100/0128-1/{208B94DE-FAE2-48A5-BEDD-F9885634B441}Img100.jpg" ;
    schema:url <http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928> ;
    schema:url <http://www.myilibrary.com?id=65470> ;
    schema:url <http://dx.doi.org/10.1002/9780471749097> ;
    schema:url <http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=176419> ;
    schema:workExample <http://worldcat.org/isbn/9780471749080> ;
    schema:workExample <http://dx.doi.org/10.1002/0471749095> ;
    schema:workExample <http://worldcat.org/isbn/9780471749097> ;
    wdrs:describedby <http://www.worldcat.org/title/-/oclc/163140623> ;
    .


Related Entities

<http://experiment.worldcat.org/entity/work/data/549801#Place/hoboken_n_j> # Hoboken, N.J.
    a schema:Place ;
    schema:name "Hoboken, N.J." ;
    .

<http://experiment.worldcat.org/entity/work/data/549801#Place/piscataway_nj> # Piscataway, NJ
    a schema:Place ;
    schema:name "Piscataway, NJ" ;
    .

<http://experiment.worldcat.org/entity/work/data/549801#Topic/technology_&_engineering_electronics_semiconductors> # TECHNOLOGY & ENGINEERING--Electronics--Semiconductors
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Semiconductors"@en ;
    .

<http://experiment.worldcat.org/entity/work/data/549801#Topic/technology_&_engineering_electronics_solid_state> # TECHNOLOGY & ENGINEERING--Electronics--Solid State
    a schema:Intangible ;
    schema:name "TECHNOLOGY & ENGINEERING--Electronics--Solid State"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh85119917> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing"@en ;
    .

<http://id.worldcat.org/fast/1112198> # Semiconductors
    a schema:Intangible ;
    schema:name "Semiconductors"@en ;
    .

<http://id.worldcat.org/fast/1112261> # Semiconductors--Testing
    a schema:Intangible ;
    schema:name "Semiconductors--Testing"@en ;
    .

<http://ieeexplore.ieee.org.ezproxy.aub.edu.lb/xpl/bkabstractplus.jsp?bkn=5237928>
    rdfs:comment "Click to connect to online resource (off-campus access)" ;
    .

<http://viaf.org/viaf/27148728> # Dieter K. Schroder
    a schema:Person ;
    schema:familyName "Schroder" ;
    schema:givenName "Dieter K." ;
    schema:name "Dieter K. Schroder" ;
    .

<http://worldcat.org/isbn/9780471749080>
    a schema:ProductModel ;
    schema:isbn "0471749087" ;
    schema:isbn "9780471749080" ;
    .

<http://worldcat.org/isbn/9780471749097>
    a schema:ProductModel ;
    schema:isbn "0471749095" ;
    schema:isbn "9780471749097" ;
    .

<http://www.worldcat.org/oclc/59360243>
    a schema:CreativeWork ;
    rdfs:label "Semiconductor material and device characterization." ;
    schema:description "Print version:" ;
    schema:isSimilarTo <http://www.worldcat.org/oclc/163140623> ; # Semiconductor material and device characterization
    .


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