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Software Reliability Engineering, ISSRE, 2008 IEEE 19th International Symposium on.

Publisher: Seattle,WA,USA.
Edition/Format:   eBook : Document : English
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Material Type: Document
Document Type: Book, Computer File
ISBN: 1424436532 9781424436538
OCLC Number: 1096618905
Description: 1 online resource
Other Titles: Applied Imagery Pattern Recognition Workshop

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