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Spectroscopic ellipsometry for photovoltaics. Volume 1, Fundamental principles and solar cell characterization

Author: Hiroyuki Fujiwara; Robert W Collins
Publisher: Cham, Switzerland : Springer, 2018.
Series: Springer series in optical sciences, v. 212.
Edition/Format:   eBook : Document : EnglishView all editions and formats
Summary:
This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety  Read more...
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Genre/Form: Electronic books
Additional Physical Format: Printed edition:
Printed edition:
Material Type: Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Hiroyuki Fujiwara; Robert W Collins
ISBN: 9783319753775 3319753770
OCLC Number: 1083114936
Description: 1 online resource (xx, 594 pages) : illustrations (some color)
Contents: Introduction --
Part I: Fundamental Principles of Ellipsometry --
Measurement Technique of Ellipsometry --
Data Analysis --
Optical Properties of Semiconductors --
Dielectric Function Modeling --
Effect of Roughness on Ellipsometry Analysis --
Part II: Characterization of Materials and Structures --
Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon --
Crystalline Silicon Solar Cells --
Amorphous/Crystalline Si Heterojunction Solar Cells --
Optical Properties of Cu(In, Ga)Se2 --
Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization --
Cu2ZnSn(S, Se)4 and Related Materials --
Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics --
High Efficiency III-V Solar Cells --
Organic Solar Cells --
Organic-Inorganic Hybrid Perovskite Solar Cells --
Solar Cells with Photonic and Plasmonic Structures --
Transparent Conductive Oxide Materials --
High-Mobility Transparent Conductive Oxide Layers.
Series Title: Springer series in optical sciences, v. 212.
Other Titles: Fundamental principles and solar cell characterization
Responsibility: Hiroyuki Fujiwara, Robert W. Collins, editors.

Abstract:

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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