skip to content
Springer handbook of metrology and testing Preview this item
ClosePreview this item
Checking...

Springer handbook of metrology and testing

Author: Horst Czichos; Tetsuya Saito; Leslie M Smith
Publisher: Berlin ; Heidelberg : Springer, cop. 2011.
Edition/Format:   Print book : English : 2nd edView all editions and formats
Summary:

The Springer Handbook of Metrology and Testing presents the principles of Metrology, and testing methods relevant to chemical and microstructural analysis. Readers will find extensive coverage of the  Read more...

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Document Type: Book
All Authors / Contributors: Horst Czichos; Tetsuya Saito; Leslie M Smith
ISBN: 9783642166402 3642166407 9783642166419 3642166415
OCLC Number: 781113682
Description: XXXII, 1229 str. : ilustr. ; 25 cm
Contents: The Springer Handbook of Metrology and Testing is a comprehensive treatise of Metrology, the science of measurement, and of Testing, the technical procedure of determining characteristics of a given object, product or process. The Handbook is organized in five parts.Part A: Fundamentals of Metrology and Testing Part A describes the basic elements of metrology, the system which allows measurements made in different laboratories to be confidently compared worldwide. The process of making reliable measurements is analyzed along with quality issues of the measurement and testing procedures.Chap. 1 Introduction to Metrology and Testing Chap. 2 Metrology Principles and Organization Chap. 3 Quality in Measurement and Testing Part B: Chemical and Microstructural AnalysisPart B presents methods for the analysis of material composition and structure. Structure here includes both atomic and molecular arrangements and also microstructure and defect structures over larger scales. Chap. 4 Analytical Chemistry Chap. 5 Nanoscopic Architecture and MicrostructureChap. 6 Surface and Interface CharacterizationPart C: Materials Properties MeasurementPart C evaluates the methods of measuring the fundamental properties of materials. In addition to all aspects of mechanical properties, the methods of characterizing the thermal, electrical, magnetic and optical properties of materials important to their practical applications are described. Chap. 7 Mechanical PropertiesChap. 8 Thermal Properties Chap. 9 Electrical PropertiesChap. 10 Magnetic Properties Chap. 11 Optical PropertiesPart D: Materials Performance TestingPart D cores the testing of material performance in application conditions. This includes measurement of corrosion, friction and wear as well as biogenic impact on materials and more specific materials environment interactions. Evaluation of material performance and condition monitoring by nondestructive techniques and embedded sensors is also considered. Finally, experimental, deterministic and probabilistic methods for the characterization of safety and reliability are outlined. Chap. 12 CorrosionChap. 13 Friction and WearChap. 14 Biogenic ImpactChap. 15 Environmental InteractionsChap. 16 Nondestructive Testing and Reliability EvaluationPart E: Modeling and Simulation MethodsPart E presents important modeling and simulation methods that underline measurement procedures that rely on mathematical models to interpret complex experiments or to estimate properties that cannot be measured directly.Chap. 17 Molecular Dynamics SimulationChap. 18 Continuum Constitutive ModelingChap. 19 Finite Element and Finite Difference MethodsChap. 20 The CALPHAD MethodChap. 21 Phase Field ApproachChap. 22 Monte Carlo SimulationAbout the Authors.- Subject Index
Responsibility: Horst Czichos, Tetsuya Saito, Leslie Smith (eds.).
More information:

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/781113682> # Springer handbook of metrology and testing
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "781113682" ;
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1044734964#Place/berlin> ; # Berlin
   library:placeOfPublication <http://experiment.worldcat.org/entity/work/data/1044734964#Place/heidelberg> ; # Heidelberg
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/gw> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1044734964#Topic/metrologie> ; # Metrologie
   schema:about <http://experiment.worldcat.org/entity/work/data/1044734964#Thing/metrologija> ; # metrologija
   schema:about <http://dewey.info/class/620.0044/e22/ger/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/1044734964#Topic/pruftechnik> ; # Prüftechnik
   schema:about <http://experiment.worldcat.org/entity/work/data/1044734964#Topic/werkstoffprufung> ; # Werkstoffprüfung
   schema:about <http://experiment.worldcat.org/entity/work/data/1044734964#Topic/chemische_analyse> ; # Chemische Analyse
   schema:bookEdition "2nd ed." ;
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "op." ;
   schema:datePublished "2011" ;
   schema:editor <http://viaf.org/viaf/48130991> ; # Leslie M. Smith
   schema:editor <http://viaf.org/viaf/116679946> ; # Tetsuya Saito
   schema:editor <http://viaf.org/viaf/10332968> ; # Horst Czichos
   schema:exampleOfWork <http://worldcat.org/entity/work/id/1044734964> ;
   schema:inLanguage "en" ;
   schema:name "Springer handbook of metrology and testing" ;
   schema:productID "781113682" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/781113682#PublicationEvent/berlin_heidelberg_springer_cop_2011> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/1044734964#Agent/springer> ; # Springer
   schema:workExample <http://worldcat.org/isbn/9783642166402> ;
   schema:workExample <http://worldcat.org/isbn/9783642166419> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/781113682> ;
    .


Related Entities

<http://viaf.org/viaf/10332968> # Horst Czichos
    a schema:Person ;
   schema:familyName "Czichos" ;
   schema:givenName "Horst" ;
   schema:name "Horst Czichos" ;
    .

<http://viaf.org/viaf/116679946> # Tetsuya Saito
    a schema:Person ;
   schema:familyName "Saito" ;
   schema:givenName "Tetsuya" ;
   schema:name "Tetsuya Saito" ;
    .

<http://viaf.org/viaf/48130991> # Leslie M. Smith
    a schema:Person ;
   schema:familyName "Smith" ;
   schema:givenName "Leslie M." ;
   schema:name "Leslie M. Smith" ;
    .

<http://worldcat.org/isbn/9783642166402>
    a schema:ProductModel ;
   schema:isbn "3642166407" ;
   schema:isbn "9783642166402" ;
    .

<http://worldcat.org/isbn/9783642166419>
    a schema:ProductModel ;
   schema:isbn "3642166415" ;
   schema:isbn "9783642166419" ;
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.