skip to content
Statistical quality control for manufacturing managers Preview this item
ClosePreview this item
Checking...

Statistical quality control for manufacturing managers

Author: William S Messina
Publisher: New York : Wiley, ©1987.
Series: Wiley series in engineering management.
Edition/Format:   Print book : EnglishView all editions and formats
Summary:

Provided in this book are the methods and tools for the manufacturing manager to improve quality, increase productivity and enhance the competitive position of the manufacturing line.

Rating:

(not yet rated) 0 with reviews - Be the first.

Subjects
More like this

Find a copy in the library

&AllPage.SpinnerRetrieving; Finding libraries that hold this item...

Details

Additional Physical Format: Online version:
Messina, William S. (William Samuel).
Statistical quality control for manufacturing managers.
New York : Wiley, ©1987
(OCoLC)569057082
Material Type: Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: William S Messina
ISBN: 0471857742 9780471857747
OCLC Number: 15108621
Notes: "A Wiley-Interscience publication."
Description: xiii, 331 pages : illustrations ; 24 cm.
Contents: Basic statistics --
Graphical methods of presentation --
Probability distributions --
Statistical inference --
Theory of statistical quality control --
Control charts --
Acceptance sampling --
Manufacturing applications --
Manufacturing strategies --
Index.
Series Title: Wiley series in engineering management.
Responsibility: William S. Messina.
More information:

Reviews

User-contributed reviews
Retrieving GoodReads reviews...
Retrieving DOGObooks reviews...

Tags

Be the first.
Confirm this request

You may have already requested this item. Please select Ok if you would like to proceed with this request anyway.

Linked Data


Primary Entity

<http://www.worldcat.org/oclc/15108621> # Statistical quality control for manufacturing managers
    a schema:Book, schema:CreativeWork ;
   library:oclcnum "15108621" ;
   library:placeOfPublication <http://id.loc.gov/vocabulary/countries/nyu> ;
   library:placeOfPublication <http://dbpedia.org/resource/New_York_City> ; # New York
   schema:about <http://id.worldcat.org/fast/1085001> ; # Quality control--Statistical methods
   schema:about <http://dewey.info/class/658.562/e19/> ;
   schema:about <http://experiment.worldcat.org/entity/work/data/8377985#Topic/statistische_qualitatskontrolle> ; # Statistische Qualitätskontrolle
   schema:about <http://id.loc.gov/authorities/subjects/sh2008110287> ; # Quality control--Statistical methods
   schema:about <http://experiment.worldcat.org/entity/work/data/8377985#Thing/industries> ; # Industries
   schema:bookFormat bgn:PrintBook ;
   schema:copyrightYear "1987" ;
   schema:creator <http://viaf.org/viaf/40857124> ; # William Samuel Messina
   schema:datePublished "1987" ;
   schema:description "Basic statistics -- Graphical methods of presentation -- Probability distributions -- Statistical inference -- Theory of statistical quality control -- Control charts -- Acceptance sampling -- Manufacturing applications -- Manufacturing strategies -- Index."@en ;
   schema:exampleOfWork <http://worldcat.org/entity/work/id/8377985> ;
   schema:inLanguage "en" ;
   schema:isPartOf <http://experiment.worldcat.org/entity/work/data/8377985#Series/wiley_series_in_engineering_management> ; # Wiley series in engineering management.
   schema:isSimilarTo <http://www.worldcat.org/oclc/569057082> ;
   schema:name "Statistical quality control for manufacturing managers"@en ;
   schema:productID "15108621" ;
   schema:publication <http://www.worldcat.org/title/-/oclc/15108621#PublicationEvent/new_york_wiley_1987> ;
   schema:publisher <http://experiment.worldcat.org/entity/work/data/8377985#Agent/wiley> ; # Wiley
   schema:url <http://catdir.loc.gov/catdir/toc/onix01/86034022.html> ;
   schema:workExample <http://worldcat.org/isbn/9780471857747> ;
   umbel:isLike <http://bnb.data.bl.uk/id/resource/GB8816723> ;
   wdrs:describedby <http://www.worldcat.org/title/-/oclc/15108621> ;
    .


Related Entities

<http://dbpedia.org/resource/New_York_City> # New York
    a schema:Place ;
   schema:name "New York" ;
    .

<http://experiment.worldcat.org/entity/work/data/8377985#Series/wiley_series_in_engineering_management> # Wiley series in engineering management.
    a bgn:PublicationSeries ;
   schema:hasPart <http://www.worldcat.org/oclc/15108621> ; # Statistical quality control for manufacturing managers
   schema:name "Wiley series in engineering management." ;
   schema:name "Wiley series in engineering management" ;
    .

<http://experiment.worldcat.org/entity/work/data/8377985#Topic/statistische_qualitatskontrolle> # Statistische Qualitätskontrolle
    a schema:Intangible ;
   schema:name "Statistische Qualitätskontrolle"@en ;
    .

<http://id.loc.gov/authorities/subjects/sh2008110287> # Quality control--Statistical methods
    a schema:Intangible ;
   schema:name "Quality control--Statistical methods"@en ;
    .

<http://id.worldcat.org/fast/1085001> # Quality control--Statistical methods
    a schema:Intangible ;
   schema:name "Quality control--Statistical methods"@en ;
    .

<http://viaf.org/viaf/40857124> # William Samuel Messina
    a schema:Person ;
   schema:familyName "Messina" ;
   schema:givenName "William Samuel" ;
   schema:givenName "William S." ;
   schema:name "William Samuel Messina" ;
    .

<http://worldcat.org/isbn/9780471857747>
    a schema:ProductModel ;
   schema:isbn "0471857742" ;
   schema:isbn "9780471857747" ;
    .

<http://www.worldcat.org/oclc/569057082>
    a schema:CreativeWork ;
   rdfs:label "Statistical quality control for manufacturing managers." ;
   schema:description "Online version:" ;
   schema:isSimilarTo <http://www.worldcat.org/oclc/15108621> ; # Statistical quality control for manufacturing managers
    .


Content-negotiable representations

Close Window

Please sign in to WorldCat 

Don't have an account? You can easily create a free account.