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Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A.

Author: John E E Baglin; D R Campbell; Wei-Kan Chu; Materials Research Society. Fall Meeting
Publisher: New York : North-Holland, ©1984.
Series: Materials Research Society symposia proceedings, v. 25.
Edition/Format:   Print book : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Congresses
Additional Physical Format: Online version:
Thin films and interfaces II.
New York : North-Holland, ©1984
(OCoLC)613748726
Material Type: Conference publication, Internet resource
Document Type: Book, Internet Resource
All Authors / Contributors: John E E Baglin; D R Campbell; Wei-Kan Chu; Materials Research Society. Fall Meeting
ISBN: 0444009051 9780444009050
OCLC Number: 10800658
Notes: "Proceedings of the Symposium on Thin Films and Interfaces, which was held as a part of the Materials Research Society Meeting, Nov. 14-18, 1983, in Boston"--Ack.
Includes indexes.
Description: xv, 684 pages : illustrations ; 24 cm.
Contents: Phase formation and diffusion kinetics --
Ion beam effects: adhesion, conductivity, mixing --
Interfaces; grain boundaries; surfaces --
Epitaxy and microstructure --
Strained superlattices --
Silicon-on-insulator structures --
Contacts; devices technology --
Deposition methods and measurement techniques.
Series Title: Materials Research Society symposia proceedings, v. 25.
Responsibility: editors, J.E.E. Baglin, D.R. Campbell, W.K. Chu.

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