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Thirty-Fourth Annual Semiconductor Thermal Measurement and Management Symposium : March 19-23, 2018, DoubleTree Hotel, San Jose, CA, USA.

Author: Institute of Electrical and Electronics Engineers,
Publisher: Piscataway, NJ : IEEE, [2018] ©2018
Edition/Format:   eBook : Document : Conference publication : English
Summary:
Semiconductor thermal management and modeling.
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Genre/Form: Conference papers and proceedings
Congresses
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Institute of Electrical and Electronics Engineers,
OCLC Number: 1053697115
Notes: IEEE Catalog Number CFP18SEM-ART.
Target Audience: Scholarly & Professional
Description: 1 online resource : illustrations
Other Titles: 2018 34th Thermal Measurement, Modeling and Management Symposium (SEMI THERM)
34th Annual Semiconductor Thermal Measurement and Management Symposium
SEMI-THERM 2018
SEMI-THERM 34
2018 Semiconductor Therman Measurement and Management (SEMI THERM) Symposium
Thermal Measurement, Modeling & Management Symposium (SEMI-THERM), 2018 34th
2018 Proceedings, Thirty-Fourth Semiconductor Thermal Measurement, Modeling and Management Symposium
2018 34th Annual Semiconductor Thermal Measurement, Modeling and Management Symposium (SEMI THERM)

Abstract:

Semiconductor thermal management and modeling.

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