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VAST, IEEE Symposium Visual Analytics Science and Technology, 2006 : proceedings, Baltimore, Maryland, USA, October 31-November 2, 2006

Author: Pak Chung Wong; Daniel Keim; IEEE Computer Society. Technical Committee on Visualization and Graphics.; SIGGRAPH.
Publisher: Piscataway, NJ : IEEE, ©2006.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
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Genre/Form: Conference papers and proceedings
Electronic books
Congresses
Additional Physical Format: Print version:
IEEE Symposium on Visual Analytics Science and Technology (1st : 2006 : Baltimore, Md.).
VAST, IEEE Symposium Visual Analytics Science and Technology, 2006.
Piscataway, NJ : IEEE, ©2006
(DLC) 2006930989
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Pak Chung Wong; Daniel Keim; IEEE Computer Society. Technical Committee on Visualization and Graphics.; SIGGRAPH.
ISBN: 1424405912 9781424405916 1424405920 9781424405923
OCLC Number: 85811533
Language Note: English.
Notes: Title from title screen (viewed Mar. 8, 2007).
Description: 1 online resource (ix, 216 pages)
Other Titles: IEEE Symposium Visual Analytics Science and Technology
IEEE Symposium on VAST 2006
Symposium on Visual Analytics Science and Technology, 2006
Visual Analytics and Technology, 2006 IEEE Symposium on
Responsibility: edited by Pak Chung Wong, Daniel Keim ; [sponsored by IEEE Society Visualization and Graphics Technical Committee (VGTC) ; in cooperation with ACM SIGGRAPH].

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