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VLSI design and test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29-July 2, 2017, Revised selected papers

Author: Brajesh Kumar Kaushik; Sudeb Dasgupta; Virendra Singh, (Associate professor of electrical engineering)
Publisher: Singapore : Springer, 2017.
Series: Communications in computer and information science, 711.
Edition/Format:   eBook : Document : Conference publication : EnglishView all editions and formats
Summary:
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI  Read more...
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Genre/Form: Electronic books
Conference papers and proceedings
Congresses
Additional Physical Format: Printed edition:
Material Type: Conference publication, Document, Internet resource
Document Type: Internet Resource, Computer File
All Authors / Contributors: Brajesh Kumar Kaushik; Sudeb Dasgupta; Virendra Singh, (Associate professor of electrical engineering)
ISBN: 9789811074707 9811074704
OCLC Number: 1017755259
Notes: Includes author index.
Description: 1 online resource (xxi, 815 pages) : illustrations
Contents: Digital design --
Analog/mixed signal --
VLSI testing --
Devices and technology --
VLSI architectures --
Emerging technologies and memory --
System design --
Low power design and test --
RF circuits --
Architecture and CAD --
Design verification.
Series Title: Communications in computer and information science, 711.
Other Titles: VDAT 2017
Responsibility: Brajesh Kumar Kaushik, Sudeb Dasgupta, Virendra Singh (eds.).

Abstract:

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.

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