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X-ray absorption spectroscopy of semiconductors

Auteur : Claudia S Schnohr; M C Ridgway
Éditeur: Heidelberg : Springer, [2014] ©2015
Collection: Springer series in optical sciences, volume 190.
Édition/format:   Livre électronique : Document : AnglaisVoir toutes les éditions et tous les formats
Résumé:
X-ray Absorption Spectroscopy (XAS) is a powerful technique with which to probe the properties of matter, equally applicable to the solid, liquid and gas phases. Semiconductors are arguably our most technologically-relevant group of materials given they form the basis of the electronic and photonic devices that now so widely permeate almost every aspect of our society. The most effective utilisation of these  Lire la suite...
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Détails

Genre/forme: Electronic books
Format – détails additionnels: Printed edition:
Type d’ouvrage: Document, Ressource Internet
Type de document: Ressource Internet, Fichier d'ordinateur
Tous les auteurs / collaborateurs: Claudia S Schnohr; M C Ridgway
ISBN: 9783662443620 3662443627 3662443619 9783662443613
Numéro OCLC: 898138420
Description: 1 online resource (xvi, 361 pages) : illustrations (some color)
Contenu: Introduction to XAS --
Crystalline Semiconductors --
Disordered Semiconductors.- Nanostructures --
Magnetic Semiconductors.
Titre de collection: Springer series in optical sciences, volume 190.
Responsabilité: Claudia S. Schnohr, Mark C. Ridgway, editors.

Résumé:

Through a series of comprehensive reviews, this book demonstrates the versatility of XAS for semiconductor materials analysis and presents important research activities in this ever growing field.  Lire la suite...

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